Artificial aging of chips with memories

ABSTRACT

An apparatus for aging a chip, comprising a first bit line connected to a first memory cell; a second bit line connected to a second memory cell; an access circuit for accessing the first memory cell via the first bit line and for accessing the second memory cell via the second bit line; a first controller for selectively connecting/disconnecting the first bit line to the access circuit and from the access circuit, respectively; a second controller for selectively connecting/disconnecting the second bit line to the access circuit and from the access circuit, respectively; a normal operating mode controller for controlling the first and second controller, wherein the normal operating mode controller is formed such to select the first controller in a normal operating mode for accessing the first memory cell, and to connect the access circuit to the first bit line, while the second controller is controlled to disconnect the access circuit from the second bit line; wherein the apparatus comprises: an aging mode controller for controlling the first and second controller, wherein the aging mode controller is formed to control the first controller and the second controller in an aging mode such that the access circuit is connected to the first and second bit lines for a predetermined time period.

This application claims priority from German Patent Application No. 10 2004 044 150.2, which was filed on Sep. 13, 2004 and is incorporated herein by reference in its entirety.

TECHNICAL FIELD

The present invention relates to an apparatus and a method for improving artificially generated aging processes of chips.

BACKGROUND

In the production of chips, such as memory components, alterations of the electrical parameters can occur during an operating time of the chips, for example, due to weaknesses in the manufacturing process. In the present invention, a chip is a semiconductor die comprising an arrangement of circuits.

For that reason, the chips are artificially pre-aged by a so-called burn-in prior to reaching a customer. By artificial pre-aging, early failures are already provoked and sorted out prior to delivering to the customer. Thus, all in all, an improvement of the early failure rates at the customer occurs through the saturation behavior of the early failures. In order to perform pre-aging efficiently, corresponding acceleration factors are used for different early failure mechanisms. Normally, these are higher voltages and higher temperatures as well as a more effective clock ratio between an inactive and an active state.

Several memory cells present on the chip can be connected such that a read amplifier accesses a configuration of one or several memory cells via a bit line. The read amplifier, which can, for example, be designed as a sense amplifier, detects the cell signal transmitted via the bit line and/or amplifies the same. An amplified signal can then, on the one hand, be written back to a cell via the bit line and, on the other hand, be read out to the exterior. In the chip, for example, a control means controls several switches such that only a single bit line is connected to the access means during a certain time period of the read or write process. During the process of artificially generated aging the chip, the control means controls the switches such that several bit lines going out from the read amplifier are connected to the same one after the other. The other bit lines going out from the read amplifier, which are not selected, are disconnected from the read amplifier. Thus, during artificial aging in normal read/write processes, only a single bit line is connected to the read amplifier. This procedure, that only one of the bit lines going out from the read amplifier can be connected to the same by the switches for a predetermined time period, leads to the fact that the artificially generated aging process is prolonged when a predetermined aging is to be achieved, or that the artificially generated aging is reduced when the time period for the aging process is fixed.

SUMMARY OF THE INVENTION

In one aspect, the present invention provides a chip, which enables an improved artificially generated aging process, and a method for an improved artificially generated aging process.

In accordance with a first aspect, the present invention provides an apparatus for aging a chip. A first bit line is connected to a first memory cell. A second bit line is connected to a second memory cell. An access circuit accesses the first memory cell via the first bit line and the second memory cell via the second bit line. A first controller selectively connects and/or disconnects the first bit line to the access circuit and from the access circuit, respectively. A second controller selectively connects/disconnects the second bit line to the access circuit and from the access circuit, respectively. A normal operating mode controller controls the first and second controller, wherein the normal operating mode controller is formed such to select the first controller in a normal operating mode for accessing the first memory cell, and to connect the access circuit to the first bit line, while the second controller is controlled to disconnect the access circuit from the second bit line; wherein the apparatus has an aging mode controller for controlling the first and second controller, wherein the aging mode controller is formed to control the first controller and the second controller in an aging mode such that the access circuit is connected to the first and second bit lines for a predetermined time period.

In accordance with a second aspect, the present invention provides a method for aging a chip. A first bit line is connected to a first memory cell. A second bit line is connected to a second memory cell. An access circuit accesses the first memory cell via the first bit line and the second memory cell via the second bit line. A first controller selectively connects and/or disconnects the first bit line to the access circuit and from the access circuit, respectively. A second controller selectively connects/disconnects the second bit line to the access circuit and from the access circuit, respectively. A normal operating mode controller controls the first and second controller, wherein the normal operating mode controller is formed such to select the first controller in a normal operating mode for accessing the first memory cell, and to connect the access circuit to the first bit line, while the second controller is controlled to disconnect the access circuit from the second bit line; wherein the method has the step of selecting an aging mode controller for controlling the first and second controller, so that the first and second controller are selected such that the access circuit is connected to the first and second bit lines for a predetermined time period.

In accordance with a third aspect, the present invention provides a computer program with a program code for performing the method for aging a chip. A first bit line is connected to a first memory cell. A second bit line is connected to a second memory cell. An access circuit accesses the first memory cell via the first bit line and the second memory cell via the second bit line. A first controller selectively connects and/or disconnects the first bit line to the access circuit and from the access circuit, respectively. A second controller selectively connects/disconnects the second bit line to the access circuit and from the access circuit, respectively. A normal operating mode controller controls the first and second controller, wherein the normal operating mode controller is formed such to select the first controller in a normal operating mode for accessing the first memory cell, and to connect the access circuit to the first bit line, while the second controller is controlled to disconnect the access circuit from the second bit line; wherein the method has the step of selecting an aging mode controller for controlling the first and second controller, so that the first and second controller are selected such that the access circuit is connected to the first and second bit lines for a predetermined time period, when the computer program runs on a computer.

In a preferred embodiment, the present invention implements a burn-in mode control mechanism on the chip. This burn-in mode control mechanism controls the controller such that several bit lines going out from an access circuit are simultaneously connected to the access circuit for a predetermined time period.

It is an advantage of the present invention that several bit lines going out from an access circuit can be stressed at the same time and that thereby the time period for the aging process can be accelerated when the scale of the artificially generated aging is predetermined. The disadvantage of the additional implementing effort is significantly surpassed by the advantage of reducing the burn-in effort. A further advantage results when the time period for the artificially generated aging process is fixed, in that thereby a number of the artificially generated early failures increases and a number of early failures of chips delivered to the customer is reduced. Thus, the quality of the delivered chips is improved.

In other words, it is the object of the invention to make the stress between the bit lines going out from the access circuit more effective. Therefore, during the burn-in mode, the clock ratio between the active and inactive state of the bit line is increased compared to a regular access in the operating mode.

DESCRIPTION OF THE DRAWINGS

These and other objects and features of the present invention will become clear from the following description taken in conjunction with the accompanying drawings, in which:

FIG. 1 is a section of a structure of a memory field of a chip of the present invention;

FIG. 2 is a more detailed section of the structure of a chip of the present invention;

FIG. 3 a is a waveform of the voltages in an operating mode; and

FIG. 3 b is a waveform of the voltages in a burn-in mode.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

FIG. 1 shows a section of a block diagram of a chip according to an embodiment of the present invention. The block diagram shows exemplarily blocks 1 a-d of a memory field of the DRAMs, wherein, however, any number of memory blocks could be provided in the DRAM. Between the blocks, three stripes 6 a-c of read amplifiers 7 a-d are disposed. Additionally, the DRAM comprises a buffer 11 for output data. Every block 1 a-d comprises several memory cells disposed in columns and rows, bit line pairs running along the columns and word lines running along the rows, wherein exemplarily and for clarity reasons merely eight memory cells 16 a-h, four bit line pairs 21 a-d and one word line 26 are shown in block 1 c and one bit line pair 21 e in the block 1 d of the memory field. The stripes 6 a-c for read amplifiers 7 a-d include one read amplifier, such as the read amplifier 7 b for the bit line pairs 21 e and 21 b, for every pair of adjacent bit line pairs of the two respective adjacent blocks, which are associated and run away from each other. Additionally, exemplarily the read amplifiers 7 c, 7 d of the strip 6 b and the read amplifiers 7 a, 7 b of the strip 6 c are shown, which are connected to the illustrated bit line pairs 21 a-e. The buffer 11 for output data consists of cells 11 a-d of the buffer 11 and an output data bus 31.

The word line 26 is applied to a sequence of memory cells 16 a-d disposed along a row of block 1 c, wherein, as mentioned, the four cells 16 a-d are shown in this embodiment only exemplarily for all memory cells connected to the word line 26. The bit line pairs 21 a-d are connected to memory cells disposed along a column and are each connected to one of the read amplifiers 7 a-d. The bit line pair 21 e, which is part of block 1 d, is also connected to the read amplifier 7 b. Outputs of the read amplifiers 7 a-d are each connected to an input of a cell 11 a-d of the buffer 11, while the output data bus 31 is connected to the output of the buffer 11 for outputting read-out data to, for example, a CPU (not shown).

After the structure of a chip of FIG. 1 has been described above, its mode of operation during normal operation will be described below. When the CPU obtains a request for access to a certain memory address, it selects the word line 26 corresponding to this address. The block 1 a-d, in which this word line resides, is referred to as active block. The other blocks are deactivated in the meantime, wherein the corresponding means will be discussed in more detail below with reference to FIG. 2. For example, it is assumed that the word line 26 is selected. Then, the word line 26 selects the memory cells 16 a-d such that the read amplifiers 7 a-d read out the content of the memory cells 16 a-d via the bit line pairs 21 a-d. The read amplifiers 7 a-d forward the data acquired that way to the cells 11 a-d of the buffer 11. Then, this buffer puts the data on the output data bus 31, from where they are read out, for example, by an external device (not shown).

The mode of operation of the above chip during burn-in according to an embodiment of the present invention will be discussed below with reference to FIG. 2.

FIG. 2 shows a detailed section of the chip of FIG. 1 according to an embodiment of the present invention. Particularly, FIG. 2 shows the access circuit 7 b of strip 6 c, the memory cell 16 c of block 1 c, further memory cells 16 h, 16 k of the adjacent block not illustrated in FIG. 1, the bit line pairs 21 b, 21 e, word lines 26 a-c, a controller 32, field-effect transistors 36 a-d and selection lines 41 a, 41 b. The controller 32 comprises an operating mode controller 46 a, a burn-in mode control mechanism 46 b, a terminal 51 for mode selection and an address data bus 56. The bit line pair 21 b consists of bit lines 21 b 1 and 21 b 2, while the bit line pair 21 e consists of bit lines 21 e 1 and 21 e 2. The memory cells 16 c, 16 h, 16 k each consist of a capacitance 61 c, 61 h, 61 k and a transistor switch 66 c, 66 h, 66 k. The bit line pair 21 b, which is conductively connected to the memory cell 16 c for reading out the memory content is conductively connected to the read amplifier 7 b via the field-effect transistors 36 c-d. The bit line pair 21 e, to which the memory cells 16 h, 16 k are associated, is conductively connected to the read amplifier 7 b via the transistor switches 36 a, 36 b. The word lines 26 a-c are applied to the output of the controller 32 and control the transistor switches 66 c, 66 h, 66 k. The capacitances 61 c, 61 h, 61 k are conductively connected to the bit lines 21 b 1, 21 e 1 via the transistor switches 66 c, 66 h, 66 k.

First, the mode of operation of the switch of FIG. 2 will be described with reference to the normal operating mode. The controller 32 receives via the address data bus 56 information about the unit to be addressed and a word to be addressed, respectively, which is to be stored in a memory cell lying in one row. It converts this information in the operation mode controller 46 a and then activates one of the word lines 26 a-c. Simultaneously, it selects the field-effect transistors 36 a-d via the selection lines 41 a, 41 b. A signal applied to the terminal 51 for mode selection determines whether processing the address data will be performed in the operation mode controller 46 a or the burn-in controller 36 b and whether the normal operation mode or the burn-in mode is present, respectively.

a) Mode of Operation:

A selection of an operating mode is performed by a signal at the terminal 51. In the operating mode, processing of the address data is performed in the operating mode controller 46 a. This determines which of the word lines 26 a-c is to be activated, based on the address data of the memory cell 16 c, 16 h, 16 k. Additionally, it determines via a signal on the selection lines 41 a, 41 b, which of the two bit line pairs 21 b, 21 e is to be conductively connected or disconnected, respectively, to the read amplifiers 7 b in the strips 6 c, which are adjacent to the block wherein the selected bit line is, i.e., the active block, via the field-effect transistors 36 a-d. Particularly, this is performed such that only those bit line pairs are connected to the read amplifiers of the stripes adjacent to the active block, which are in the active block. If, for example, one of the two word lines 26 a, 26 b is activated, which means block 1 d (FIG. 1) is the active block, then the transistors 36 a, 36 b are informed via a signal on the selection line 41 a that the same are to connect the bit line pair 21 e conductively to the read amplifier 7 b. At the same time, the controller 32, wherein the normal operating mode controller 36 a is activated, informs the field-effect transistors 36 c, 36 d that the bit line pair 21 b is to be disconnected from the read amplifier 7 b, since the word line 26 c, which is the only word line on the left of the read amplifier 7 b in this embodiment, is not activated and this block is inactive, respectively.

In the following, exemplarily, a read-out process from the memory cell 16 k will be discussed in more detail. Therefore, the word line 26 b is activated. It controls the transistor 66 k such that it conductively connects the capacitance 61 k to the bit line 21 e 1. The bit line 21 e 2, whose length is of the same order of magnitude as the one of the bit line 21 e 1, also has a capacitance with the same order of magnitude. The capacitance of the bit line 21 e 2 is often referred to as reference capacitance. During the read out process, the read amplifier 7 b sees an interconnection between the capacitances of the bit lines 21 e 1, 21 e 2 and the capacitance 61 k. In this arrangement, the bit lines 21 e 1, 21 e 2 are connected such that they compensate each other and the read amplifier 7 b can thereby detect a load state of the capacitance 61 k more easily.

b) Burn-In Mode

By a signal at the terminal 51 for mode selection, the burn-in mode controller 46 b is activated in the controller 32. In that mode, the controller 32 and 46 b, respectively, activates all bit lines according to a predetermined sequence. If a word line, such as the word line 26 b, is activated, the controller 46 b informs the field-effect transistors 46 a, 46 b via the selection line 41 a that they are to connect the bit line pair 21 e conductively to the read amplifier 7 b. At the same time, it informs the field-effect transistors 36 c, 36 d at least during part of the time period when the bit line pair 21 e is conductively connected to the read amplifier 7 b via the selection line 41 d, that they are to conductively connect also the bit line pair 21 b to the read amplifier 7 b. Thereby, the bit line pair 21 b is conductively connected to the read amplifier 7 b in a predetermined time period, where it would otherwise be disconnected from the read amplifier 7 b, when the selection was performed via the operating mode controller 46 a and not via the burn-in mode controller 46 b. This leads to additional stress and load, respectively, and thus to artificial aging of the bit line pair 21 b, which would otherwise not take place in the operating mode.

The consequences of this burn-in mode can be discussed for a certain batch of chips with regard to cases a) and b). The batch has to consist of an amount of 100,000 units, which would show 60 early failures in an aging process performed via the operating mode, and 20 early failures at the customer within a first half year, during which the customer uses the units. In scenario a), where the artificially generated aging is performed in the burn-in mode over the same time period as in the operating mode, now 70 units fail during the artificially generated aging process and there will be only 10 failures at the customer within the first half year through the usage of the burn-in mode and the corresponding selection of the burn-in mode controller 46 b. Thus, the quality of the delivered products has improved.

In case b), the time during which the batch passes through the artificially generated aging process, is reduced, for example, from 1,000 hours to 500 hours. During these 500 hours again 60 early failures result, since the units are stressed more intensely in these 500 hours. Here, also 20 units fail in the first half year at the customer. The quality of the delivered units has remained constant compared to an artificially generated aging process in the operating mode, but the time for the artificially generated aging process could be halved and thus the cost could be reduced significantly.

FIG. 3 a shows exemplary waveforms at dedicated lines according to an embodiment of the present invention for illustrating the selection of the memory element 16 k in the normal operating mode in more detail.

A top diagram of FIG. 3 a, where the time is plotted along the x-axis and the voltage along the y-axis in arbitrary units, shows a waveform of a signal WL at the word line 26 b and a signal ISO_(active) at the selection line 41 a. At a time t₀, the two lines are on their output voltages U₁, U₂. At a time t₁, the voltage on the word line 26 b, which is illustrated as signal WL in the top diagram, is raised by a certain value to the level U_(1a). This result is illustrated in the diagram by an edge 101. At the time t₁, the selection line 41 a is also activated in parallel to the word line 26 b. It is then raised from the output level U₂ by a certain value to the level U_(2a), which is illustrated in an edge 106. At a time t₆, the read-out process from the memory cell 16 k is terminated. Therefore, the signal WL on the word line 26 b is reduced from the value U_(1a) to the output level at the time t₀ U₁, which is illustrated by an edge 128. Thereby, the word line 26 b is deactivated and the capacitance 61 k is disconnected from the bit line pair 21 e by the transistor switch 66 k. Simultaneously, at the time t₆, the bit line pair 21 e is disconnected from the read amplifier 7 b, by reducing the voltage on the selection line 41 a from the value U_(2a) to its output value, the value at the time t₀. This is illustrated in an edge 131.

In a bottom diagram of FIG. 3 a, where the time is plotted along the x-axis and the voltage along the y-axis in arbitrary units, a waveform ISO_(adjacent) is illustrated on the selection line 41 b, as it is generated by the normal operating mode control 46 b. As has already been mentioned, all waveforms represented in this diagram relate to a configuration in the controller 36 where the operating mode controller 46 a is selected by the terminal 51. A voltage on the selection line 41 b is U₃ at a time t₀, and is lowered by a certain value to the level U_(3a) at the time t₁, which is illustrated in edge 111. This informs the field-effect transistors 36 c, 36 d that the disconnection of the bit line pair 21 b from the read amplifier 7 b is to be maintained during the read out process of the memory cell 16 k via the bit line pair 21 e. At a time t₆, the voltage at the selection line 41 b is raised by a predetermined value, so that it reaches again the initial level U₃, that it already had at a time t₀. During the whole time period, the bit line pair 21 b is disconnected from the read amplifier 7 b by the field-effect transistors 36 c, 36 d. Thus, the voltage on the bit lines 21 b 1, 21 b 2 remains constant on an initial level U₅ during the whole time period, from the time t₀ to a time t₉ when the whole read out process is completed in the active field, which means from the memory cell 16 k.

In the bottom diagram of FIG. 3 a, the voltage on the bit line pair 21 e, BL_(active) is illustrated, which results due to the signals WL, ISO_(active) and ISO_(adjacent) set by the control 46 a. The bit line 21 e 1 tilts from an initial level U₄ at a time t₂, which is after the time t₁, either towards the bottom, which is illustrated in an edge 116, when a low charge state is present on the capacitance 61 k, or towards the top, which is illustrated in an edge 121, when a high charge state is present on the capacitance 61 k. The bit line 21 e 2 behaves exactly inverse to 21 e 1. A voltage difference is formed between 21 e 1 and 21 e 2.

At a time t₇, the voltage between the bit line pair 21 e starts to return to its initial level U₄ via edges 141 or 146, which is terminated at a time t₉.

FIG. 3 b shows an exemplary waveform at the lines of FIG. 3 a, when the burn-in mode controller 46 b is active in the controller 32, and this selection has been made by a corresponding signal at the terminal 51.

In a top diagram of FIG. 3 b, where the time is plotted along the x-axis and the voltage along the y-axis in arbitrary units, again, the waveform WL is illustrated at a word line 26 b WL and the waveform ISO_(active) at a selection line 41 a. It can be seen that the waveform WL on the word line 26 b and ISO_(active) on the selection line 41 a have not changed compared to the normal operating mode, which is illustrated in FIG. 3 a in the top diagram.

A bottom diagram of FIG. 3 b, where the time is plotted along the x-axis and the voltage along the y-axis in arbitrary units, shows the voltage curve at the bit line pair 21 b, BL_(adjacent) and on the selection line 41 b ISO_(adjacent). Here, it can be seen that at a time t₃, the signal on the selection line 41 b is raised from an initial value U₃ by a certain value to a level U_(3b), which is illustrated in an edge 151. This signal leads to the bit line pair being conductively connected to the read amplifier 7 b while the bit line pair 21 e is also conductively connected to the read amplifier 7 b. On the bit line pair 21 b BL_(adjacent), from t₃ onwards, the same voltage ratios occur as in the bit line pair 21 e, BL_(active). At the time t₆, the voltage on the selection line 41 b is reset from the level U_(3b) by a certain value to the initial level U₃, which is illustrated in an edge 166. This leads to disconnecting the bit line pair 21 b from the read amplifier 7 b. Thus, at a time t₈, when the voltage between the bit line pair 21 b has fully returned to the initial level U₄, the bit line pair 21 b is also disconnected from the read amplifier 7 b. By the different curve of the signal BL_(adjacent) in the bottom diagram of FIG. 3 b compared to the bottom diagram of FIG. 3 a, it can be seen that the bit line pair 21 b in the burn-in mode experiences additional stress. This additional stress leads again to an improved artificially aging of the chip.

For explanation purposes, only relatively few memory cells are mentioned in the above embodiments. The number of memory cells in the blocks in common chips can of course be up to several millions, which also leads to the fact that the number of bit line pairs and word line pairs in a block in commercial chips can be up to an order of magnitude of several thousands. Also, the field-effect transistors 36 a-d can be designed as arbitrary controllable circuit elements, such as bipolar circuit elements or even tyristors, etc. The transistor switches 66 a-c can also be designed as arbitrary circuit elements. The arrangement of the bit line pairs 21 b, 21 e and their number can also be varied arbitrarily. For example, bit line pairs can go out radially from the read amplifier 7 b, which are stressed in a different way in the burn-in mode and the operating mode.

The memory cells mentioned in these embodiments can also be DRAM memory cells, SRAM memory cells, EEPROM memory cells, ROM memory cells or EPROM memory cells.

Thus, the above embodiments describe a DRAM where the memory field of DRAM consists of rows along which the word lines 26, 26 a-d extend and columns along which the bit lines 21 a-e extend. In a memory access, first, a word line 26, 26 a-c is activated. Thereby, the memory cells arranged in one row are connected to one bit line. At the end of the bit line is a read amplifier 7 a-d which can be designed as sense amplifier and detects and amplifies the cell signal transmitted via the bit line. The amplified signal is, on the one hand, written back via the bit line into the cell and can, on the other hand, be read out to the exterior. The process described herein is performed simultaneously for all cells disposed in one word line. This means also that after the activation all bit lines are provided with a signal.

In order to achieve an arrangement of the cell field, which is as compact as possible, bit lines, which are as long as possible, are desirable. However, on the other hand, this leads to a reduction of the signal to be detected by the read amplifier. Thus, in one embodiment of a commercial chip, it is possible to divide the cell field of a DRAM into individual blocks. In order to save space, the stripe for read amplifiers 6 a-c disposed between two cell field blocks is used either for the bit line coming from the left or the bit line coming from the right, depending on the activated word line, which is often referred to as shared SA concept in literature. During the activation of a word line in a certain block of the memory field, such as an array block, the bit lines of this block are provided with a voltage signal. All other array blocks remain in the deactivated state.

According to the above embodiments, the stress between adjacent bit lines has been made more effective. Thereby, a method has been used to increase the clock ratio between the active and the inactive state of the bit lines during the burn-in compared to the regular access per test mode. In the normal operation, the read amplifier 7 b is connected only to the array block with activated word line. Via a signal ISO_(active), the corresponding NFET transistors 36 a-d between the bit lines and the read amplifier 7 a-d have been selected. Only in that array block, the bit lines are provided with a voltage difference. At the same time, the transistors lying on the opposite side of the read amplifier 7 a-d are turned off via the signal ISO_(adjacent). And all bit lines in the adjacent array block remain on the same potential. Now, for improved artificial aging of the chips according to the above embodiments, the connection to the adjacent array block has been established with a time delay. Thereby, the same voltage difference has been set up between adjacent bit lines as in the actually activated array block. The time delay can thereby be about 10 nanoseconds and ensure that the read process in the active array block is not interfered with.

The above-described time delay could preferably also be between 5 ns and 20 ns to not interfere with the read out process from the activated array block.

By introducing this test mode, stress between bit lines during burn-in is accelerated by, for example, a factor of 2. This advantage can either be used for quality improvement or for test time savings, which corresponds to a productivity improvement.

Particularly, it should be noted that depending on the circumstances the inventive scheme can also be implemented in software. The implementation can also be carried out in a digital memory medium, particularly a disc or a CD with electronically readable control signals, which can cooperate with a programmable computer system such that the corresponding method is executed. Thus, generally, the invention consists also of a computer program product with a program code for performing the inventive method stored on a machine-readable carrier, when the computer program product runs on a computer. In other words, the invention can also be realized as computer program with program code for performing the method when the computer program runs on a computer.

While this invention has been described in terms of several preferred embodiments, there are alterations, permutations, and equivalents which fall within the scope of this invention. It should also be noted that there are many alternative ways of implementing the methods and compositions of the present invention. It is therefore intended that the following appended claims be interpreted as including all such alterations, permutations, and equivalents as fall within the true spirit and scope of the present invention. 

1. An apparatus for aging a chip, comprising: a first bit line connected to a first memory cell; a second bit line connected to a second memory cell; an access element for accessing the first memory cell via the first bit line and for accessing the second memory cell via the second bit line; a first controllable element for selectively connecting/disconnecting the first bit line to the access element and from the access element, respectively; a second controllable element for selectively connecting/disconnecting the second bit line to the access element and from the access element, respectively; a normal operating mode controller for controlling the first and second controllable element, wherein the normal operating mode controller is formed such to select the first controllable element in a normal operating mode for accessing the first memory cell, and to connect the access element to the first bit line, while the second controllable element is controlled to disconnect the access element from the second bit line; an aging mode controller for controlling the first and second controllable elements, wherein the aging mode controller is formed to control the first controllable element and the second controllable element in an aging mode such that the access element is connected to the first and second bit lines for a predetermined time period.
 2. The apparatus according to claim 1, wherein the access element is a read amplifier.
 3. The apparatus according to claim 1, wherein several access elements are disposed in stripe-shaped fields on the chip.
 4. The apparatus according to claim 1, wherein two bit lines connected to the access element run in opposite directions.
 5. The apparatus according to claim 1, wherein the aging mode controller is formed to control the first and second controllable elements in the aging mode such that the first controllable element connects the access element to the first and second bit lines between 5 ns and 20 ns after the second controllable element.
 6. The apparatus according to claim 5, wherein the aging mode controller is formed to control the first and second controllable elements in the aging mode such that the first controllable element connects the access element to the first and second bit lines between 8 ns and 12 ns after the second controllable element.
 7. The apparatus according to claim 1, wherein the memory cells are volatile.
 8. The apparatus according to claim 7, wherein the memory cells are DRAM cells.
 9. The apparatus according to claim 1, wherein the memory cells are arranged in rows and columns.
 10. The apparatus according to claim 1, wherein the chip further comprises a word line and the normal operating mode controller is formed to address the memory cell via the word line for access.
 11. The apparatus according to claim 10, wherein the normal operating mode controller is formed such that during selecting one of the word lines, the controllable units are selected such that a predefined configuration of bit lines is connected to the access element.
 12. The apparatus according to claim 1, wherein the aging mode controller puts the chip into the aging mode upon a signal from an external device.
 13. The apparatus according to claim 1, wherein the chip is housed.
 14. The apparatus according to claim 1, wherein the chip is formed from a wafer.
 15. A method for aging a chip, comprising: a first bit line connected to a first memory cell; a second bit line connected to a second memory cell; an access element for accessing the first memory cell via the first bit line and for accessing the second memory cell via the second bit line; a first controllable element for selectively connecting/disconnecting the first bit line to the access element and from the access element, respectively; a second controllable element for selectively connecting/disconnecting the second bit line to the access element and from the access element, respectively; a normal operating mode controller for controlling the first and second controllable elements, wherein the normal operating mode controller is formed such to select the first controllable element in a normal operating mode for accessing the first memory cell, and to connect the access element to the first bit line, while the second controllable element is controlled to disconnect the access element from the second bit line; wherein the method comprises: selecting an aging mode controller for controlling the first and second controllable elements, so that the first and second controllable elements are selected such that the access element is connected to the first and second bit lines for a predetermined time period.
 16. Computer program with a program code for performing the method for aging a chip, comprising: a first bit line connected to a first memory cell; a second bit line connected to a second memory cell; an access element for accessing the first memory cell via the first bit line and for accessing the second memory cell via the second bit line; a first controllable element for selectively connecting/disconnecting the first bit line to the access element and from the access element, respectively; a second controllable element for selectively connecting/disconnecting the second bit line to the access element and from the access element, respectively; a normal operating mode controller for controlling the first and second controllable elements, wherein the normal operating mode controller is formed such to select the first controllable element in a normal operating mode for accessing the first memory cell, and to connect the access element to the first bit line, while the second controllable element is controlled to disconnect the access element from the second bit line; wherein the method comprises: selecting an aging mode controller for controlling the first and second controllable elements, so that the first and second controllable elements are selected such that the access element is connected to the first and second bit lines for a predetermined time period, when the computer program runs on a computer. 